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VTS : 2014 IEEE 32nd VLSI Test Symposium : 13-17 April 2014.
IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online
IEEE Xplore (IEEE/IET Electronic Library - IEL)- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE VLSI Test Symposium (32nd : 2014 : Napa, Calif.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Testing--Congresses.
- Integrated circuits.
- Physical Description:
- 1 online resource (260 pages)
- Place of Publication:
- New York : IEEE, 2014.
- Notes:
- Description based on: online resource; title from title screen (IEEE Xplore Digital Library, viewed March 10, 2018).
- ISBN:
- 1-4799-2611-6
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