My Account Log in

1 option

Dependable Systems and Networks Workshops (DSN-W), 2015 IEEE International Conference on / Institute of Electrical and Electronics Engineers.

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

View online
Format:
Book
Author/Creator:
Institute of Electrical and Electronics Engineers, author, issuing body.
Language:
English
Subjects (All):
Fault-tolerant computing--Congresses.
Fault-tolerant computing.
Physical Description:
1 online resource
Other Title:
2015 IEEE International Conference on Dependable Systems and Networks Workshops
Dependable Systems and Networks Workshops
Place of Publication:
Los Alamitos, California : Institute of Electrical and Electronics Engineers, 2015.
Summary:
Annotation Dependable systems must be reliable, trustable, available and resilient to malicious attacks, accidental faults and design errors to attend our society, strongly dependent on computers and software products Computer malfunctioning in various application areas, such as bank transactions, transportation, medical equipment, satellites, telecommunication networks among others, can impact people who use vulnerable systems and services The researches developed in these areas aiming for dependability of systems and software can find in DSN the most important conference in the world to discuss how such systems should be developed, tested and evaluated The conference offers an international forum to present research results, solutions to problems, insights into emerging challenges in a rich program addressing multiple facets of dependable and secure computing, and network.
Notes:
Description based on publisher supplied metadata and other sources.
ISBN:
9781467380447
146738044X

The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.

Find

Home Release notes

My Account

Shelf Request an item Bookmarks Fines and fees Settings

Guides

Using the Find catalog Using Articles+ Using your account