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2013 8th IEEE Design and Test Symposium / Institute of Electrical and Electronics Engineers.
IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online
IEEE Xplore (IEEE/IET Electronic Library - IEL)- Format:
- Book
- Language:
- English
- Subjects (All):
- Electronic circuit design--Congresses.
- Integrated circuits--Testing--Congresses.
- Electronic circuits--Testing--Congresses.
- Physical Description:
- 1 online resource : illustrations
- Other Title:
- Design and Test Symposium
- Place of Publication:
- Piscataway, New Jersey : Institute of Electrical and Electronics Engineers (IEEE), 2013.
- Summary:
- The International Design and Test Symposium explores emerging challenges and novel concepts in design, automation, test and reliability of electronic products ranging from integrated circuits through multi chip modules and printed circuit boards to full systems and microsystems IDT provides unique forum to discuss best practices and novel ideas in design methods, tools, test and reliability in the Middle East and Africa (MEA) region.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 9781479935253
- 1479935255
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