My Account Log in

1 option

Reliability and Maintainability Symposium (RAMS), 2015 Annual / Institute of Electrical and Electronics Engineers.

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

View online
Format:
Book
Author/Creator:
Institute of Electrical and Electronics Engineers, author, issuing body.
Language:
English
Subjects (All):
Maintainability (Engineering).
Reliability (Engineering)--Congresses.
Reliability (Engineering).
Physical Description:
1 online resource (867 pages)
Other Title:
2015 Annual Reliability and Maintainability Symposium (RAMS)
2015 Annual Reliability and Maintainability Symposium
Reliability and Maintainability Symposium
Place of Publication:
Piscataway, NJ : IEEE, 2015.
Summary:
This conf covers all facets of the assurance sciences.
Contents:
Gas turbine APU reliability modeling and failure forecasting
Author index
[Copyright notice]
[Front cover]
Reliability and probabilistic risk assessment - How they play together
Modelling delay propagation within a train communication network
Reliability growth assessment under several operating stress conditions
Operation and maintenance decision-making using prognostic information
A Petri Net model for electrical power systems operating procedures
A new reliability growth model with dual-time domain - A hard disk drive perspective.
Notes:
Description based on publisher supplied metadata and other sources.
ISBN:
9781479967032
1479967033

The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.

My Account

Shelf Request an item Bookmarks Fines and fees Settings

Guides

Using the Library Catalog Using Articles+ Library Account