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Proceedings of the ... International Conference on Microelectronic Test Structures / IEEE International Conference on Microelectronic Test Structures.
- Format:
- Conference/Event
- Journal/Periodical
- Conference Name:
- IEEE International Conference on Microelectronic Test Structures.
- Language:
- English
- Subjects (All):
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Integrated circuits--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- Annual
- 1989-
- Other Title:
- Vols. for <1996-> have title: Proceedings
- ICMTS
- International Conference on Microelectronic Test Structures proceedings
- IEEE International Conference on Microelectronic Test Structures proceedings
- Place of Publication:
- New York, N.Y. : Institute of Electrical and Electronics Engineers
- System Details:
- Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. http://purl.oclc.org/DLF/benchrepro0212
- Notes:
- Vols. for 1989 sponsored by the IEEE Electron Devices Society in cooperation with the IEE; for 1990-<1992> by the Society.
- Description based on print version record.
- Latest issue consulted: 1992.
- ISSN:
- 2158-1029
- OCLC:
- 604357480
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