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ICMTS 2015 : proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures : March 23-26, 2015, Doubletree Hotel, Tempe, Arizona / sponsored by the IEEE Electron Devices Society.

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

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Format:
Book
Conference/Event
Contributor:
IEEE Electron Devices Society, sponsoring body.
Conference Name:
IEEE International Conference on Microelectronic Test Structures (2015 : Tempe, Ariz.)
Language:
English
Subjects (All):
Integrated circuits--Testing--Congresses.
Integrated circuits.
Semiconductors--Testing--Congresses.
Semiconductors.
Electronic apparatus and appliances--Testing--Congresses.
Electronic apparatus and appliances.
Physical Description:
1 online resource (217 pages)
Place of Publication:
Piscataway, New Jersey : Institute of Electrical and Electronics Engineers, 2015.
Notes:
Description based on: online resource; title from pdf title page (IEEE Xplore, viewed June 1, 2020).
ISBN:
1-4799-8304-7

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