Proceedings, 2014 IEEE Far East Forum on Nondestructive Evaluation/Testing : New Technology & Application : Increasingly Perfect NDT/E : June 20-23, 2014 Chengdu, China / edited by Chunguang Xu, Liu Yang, Qinxue Pan.

Format:

Book

Contributor:

Xu, Chunguang, editor.

Yang, Liu, editor.

Pan, Qinxue, editor.

Language:

English

Subjects (All):

Nondestructive testing--Congresses.

Nondestructive testing.

Physical Description:

1 online resource (367 pages) : illustrations

Other Title:

2014 IEEE Far East Forum on Nondestructive Evaluation/Testing

Nondestructive Evaluation/Testing

Place of Publication:

Piscataway, NJ : IEEE, [2014]

Summary:

Aiming at strengthening academic communication and promoting the innovation development of nondestructive testing, the International Far East Forum on Nondestructive Evaluation Testing (FENDT) has become the most important event for Nondestructive Evaluation Testing in China since its inception in Nanjing, 2004 The forum assembles all the professionals such as leading researchers, engineers, scientists, industrial people and students worldwide under one roof every year It is a great platform for sharing experiences, innovative ideas, industrial progresses and research results in the field of Ultrasonic Evaluation Testing, Magnetic particle Testing, Radiographic Testing and Eddy current Testing etc The conference papers that reviewed by experts organized will be published and cited by IEEE The conference also provides a showcase platform for companies to exhibit their latest technology and products FENDT 2014 with an expected 600 participants is the ideal occasion to exhibit you.

Notes:

Description based on publisher supplied metadata and other sources.

ISBN:

1-4799-4730-X