IEEE Std C37.26-2014 (Revision of IEEE Std C37.26-2003) : IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage (1000 V AC or lower) Inductive Test Circuits / IEEE.

Format:

Book

Author/Creator:

Institute of Electrical and Electronics Engineers, author, issuing body.

Language:

English

Subjects (All):

Electric circuits--Standards.

Electric circuits.

Physical Description:

1 online resource (ix, 10 pages)

Other Title:

C37.26-2014 - IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage

IEEE Std C37.26-2014 (Revision of IEEE Std C37.26-2003): IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage (1000 V AC or lower) Inductive Test Circuits

IEEE Std C37.26-2014

IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage

Place of Publication:

New York : IEEE, 2014.

Summary:

Methods for determining the value of the power factor for inductive low-voltage (1000 V ac and lower) test circuits are provided. These methods are used in determining the power factor during short-circuit current tests in high-power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used shall have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 V ac) but may also be used for higher voltages. Keywords: IEEE C37.26, inductive test circuits, power factor.

Notes:

Description based on publisher supplied metadata and other sources.

ISBN:

0-7381-9326-7