IEEE Std 1450.6-2005 : IEEE standard test interface language (STIL) for digital test vector data--core test language (CTL) / IEEE Computer Society Test Technology Standards Committee, Institute of Electrical and Electronics Engineers, IEEE-SA Standards Board, American National Standards Institute.

Format:

Book

Author/Creator:

IEEE Computer Society. Test Technology Standards Committee, author, issuing body.

Institute of Electrical and Electronics Engineers, author, issuing body.

IEEE-SA Standards Board, author, issuing body.

American National Standards Institute, author.

Contributor:

Institute of Electrical and Electronics Engineers, author, issuing body.

IEEE-SA Standards Board, author, issuing body.

American National Standards Institute, author.

Language:

English

Subjects (All):

Computer hardware description languages.

Physical Description:

1 online resource (xii, 113 pages) : illustrations

Other Title:

1450.6-2005 - IEEE Standard Test Interface Language

1450.6-2006 - IEEE Standard Test Interface Language

IEEE Std 1450.6-2005: IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)

Place of Publication:

New York : IEEE, [2006]

Summary:

The Core Test Language (CTL) is a language created for a System-on-Chip flow (or SoC flow), where a design created by one group is reused as a sub-design of a design created by another group. In an SoC flow, the smaller design embedded in the larger design is commonly called a core and the larger design is commonly called the SoC. The core is a design provided by a core provider, and the task of incorporating the sub-design into the SoC is called Core System Integration.

Notes:

Description based on publisher supplied metadata and other sources.

ISBN:

0-7381-4805-9