1 option
IEEE trial-use standard for testability and diagnosability characteristics and metrics / IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems, Institute of Electrical and Electronics Engineers, IEEE-SA Standards Board.
- Format:
- Book
- Author/Creator:
- IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems, author, issuing body.
- Language:
- English
- Subjects (All):
- Artificial intelligence--Standards.
- Artificial intelligence.
- Expert systems (Computer science)--Standards.
- Expert systems (Computer science).
- Physical Description:
- 1 online resource (v, 35 pages)
- Other Title:
- IEEE Std 1522-2004: IEEE Trial-Use Standard for Testability and Diagnosability Characteristics and Metrics
- Place of Publication:
- New York, N.Y. : Institute of Electrical and Electronics Engineers, 2005.
- Summary:
- This standard was developed to provide standard, unambiguous definitions of testability diagnosability metrics and characteristics. It builds on fundamental definitions derived from elements in formal information models related to test and diagnosis defined in IEEE Std 1232-2002.
- Notes:
- Description based on publisher supplied metadata and other sources.
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.