IEEE Std 1671.1-2009 (Full_Use) / IEEE.

Format:

Book

Author/Creator:

Institute of Electrical and Electronics Engineers, author, issuing body.

Language:

English

Subjects (All):

Automatic test equipment.

Physical Description:

1 online resource (195 pages)

Other Title:

1671.1-2009 - IEEE Standard for Automatic Test Markup Language

IEEE Std 1671.1-2009 (Full_Use): IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions

IEEE Standard for Automatic Test Markup Language

IEEE Std 1671.1-2009

Place of Publication:

New York : IEEE, 2009.

Summary:

This document specifies an exchange format, using the extensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a Unit Under Test (UUT). This is in support of the development of Test Program Sets (TPSs) that will be used in an automatic test environment.

Notes:

Description based on publisher supplied metadata and other sources.

ISBN:

0-7381-8152-8