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IEEE Std 1671.1-2009 : IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions / Institute of Electrical and Electronics Engineers.
IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online
IEEE Xplore (IEEE/IET Electronic Library - IEL)- Format:
- Book
- Language:
- English
- Subjects (All):
- Automatic test equipment.
- Physical Description:
- 1 online resource (viii, 185 pages) : illustrations
- Other Title:
- 1671.1-2009 - IEEE Trial-Use Standard for Automatic Test Markup Language
- IEEE Std 1671.1-2009
- Place of Publication:
- New York : IEEE, 2009.
- Summary:
- This document specifies an exchange format, using the eXtensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a unit under test (UUT). This is in support of the development of test program sets (TPSs) that will be used in an automatic test environment. Keywords: automatic test equipment (ATE), Automatic Test Markup Language (ATML), Automatic Test Markup Language (ATML) instance document, automatic test system (ATS), diagnostic requirements, test description, Test Program Set (TPS), test requirements, Test Requirements Document (TRD), XML schema.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 0-7381-6066-0
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