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IEEE Std 1671.4-2007 : IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information / Institute of Electrical and Electronics Engineers.
IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online
IEEE Xplore (IEEE/IET Electronic Library - IEL)- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- XML (Document markup language).
- Automatic test equipment.
- Digital electronics.
- Physical Description:
- 1 online resource (viii, 22 pages) : illustrations
- Other Title:
- 1671.4-2007 - IEEE Standard for Automatic Test Markup Language
- IEEE Std 1671.4-2007
- IEEE Standard for Automatic Test Markup Language
- Place of Publication:
- New York : IEEE, 2008.
- Summary:
- This document specifies an exchange format, using XML, for identifying the test configuration used to test and diagnose a unit under test (UUT) on an automatic test system (ATS).
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 0-7381-5370-2
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