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IEEE Std 1671.3-2007 / IEEE.
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- Hardware.
- Patents.
- Trademarks.
- Physical Description:
- 1 online resource (33 pages)
- Other Title:
- 1671.3-2007 - IEEE Standard for Automatic Test Markup Language
- IEEE Std 1671.3-2007: IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information
- IEEE Standard for Automatic Test Markup Language
- Place of Publication:
- New York : IEEE, 2008.
- Summary:
- This document specifies an exchange format, using XML, for identifying all of the hardware, software, and documentation associated with a unit under test (UUT). This UUT may be tested and diagnosed using a test program set (TPS) on an automatic test system (ATS).
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 0-7381-9237-6
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