1 option
IEEE Std 1671.5-2008 (Full_Use) : IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information / IEEE.
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- Automatic test equipment--Congresses.
- Automatic test equipment.
- Physical Description:
- 1 online resource (viii, 29 pages) : illustrations
- Other Title:
- 1671.5-2008 - IEEE Standard for Automatic Test Markup Language
- IEEE Standard for Automatic Test Markup Language
- IEEE Std 1671.5-2008
- Place of Publication:
- New York, N.Y. : IEEE, 2012.
- Summary:
- An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used as a component of a test program set to test and diagnose a unit under test.
- Notes:
- Description based on publisher supplied metadata and other sources.
- Includes bibliographical references.
- ISBN:
- 0-7381-8166-8
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.