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IEC standard testability method for embedded core-based integrated circuits.

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

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Format:
Book
Author/Creator:
Institute of Electrical and Electronics Engineers, author, issuing body.
Language:
English
Subjects (All):
Embedded computer systems--Testing--Standards.
Embedded computer systems.
Systems on a chip--Testing--Standards.
Systems on a chip.
Integrated circuits--Testing--Standards.
Integrated circuits.
Physical Description:
1 online resource (349 pages)
Place of Publication:
New York : IEEE, 2007.
Notes:
Description based on: online resource; title from title screen (IEEE Xplore Digital Library, viewed Oct. 20, 2017).
ISBN:
0-7381-5724-4

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