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IEEE design & test.

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available from 2013 volume: 30 issue: 1. Available online

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Format:
Journal/Periodical
Contributor:
Institute of Electrical and Electronics Engineers.
IEEE Circuits and Systems Society.
IEEE Council on Electronic Design Automation.
IEEE Solid-State Circuits Society.
IEEE Computer Society. Technical Council on Test Technology.
Standardized Title:
IEEE design & test (Online)
Language:
English
Subjects (All):
Computer engineering--Periodicals.
Computer engineering.
Genre:
Periodicals.
Physical Description:
Six issues yearly
Began with: Volume 30, number 1 (January/February 2013).
Other Title:
IEEE design and test
Continues:
IEEE Design & Test of Computers
Place of Publication:
New York, NY : Institute of Electrical and Electronics Engineers
Notes:
Refereed/Peer-reviewed
Publication of the IEEE Circuits and Systems Society, IEEE Council on Electronic Design Automation, IEEE Solid State Circuits Society, and the IEEE Test Technology Technical Council.
Description based on: Volume 30, number 1 (January/February 2013); title from cover PDF (IEEE, viewed Oct. 17, 2013).
Latest issue consulted: Volume 31, issue 1 (Jan/Feb 2014) (IEEE, viewed Feb 26, 2014).
ISSN:
2168-2364
OCLC:
795368469

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