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IEEE Std 1005-1998 : IEEE standard definitions and characterization of floating gate semiconductor arrays / Institute of Electrical and Electronics Engineers.
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Series:
- Institute of Electrical and Electronics Engineers
- Language:
- English
- Subjects (All):
- Semiconductor storage devices.
- Physical Description:
- 1 online resource (vi, 123 pages) : illustrations.
- Other Title:
- IEEE Std 1005-1998: IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays
- Place of Publication:
- New York, N.Y. : IEEE, 1998.
- Summary:
- This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E²PROMs, and block rewritable "flash" EEPROMs. In addition, reliability hazards are covered with focus on retention, endurance, and disturb. There are also clauses on the issues of testing floating gate arrays and their hardness to ionizing radiation.
- Notes:
- Description based on publisher supplied metadata and other sources.
- Includes bibliographical references.
- ISBN:
- 0-7381-3952-1
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