1 option
IEEE Standard Test Access Port and Boundary : Scan Architecture / Institute of Electrical and Electronics Engineers.
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- Architectural design--History.
- Architectural design.
- Physical Description:
- 1 online resource
- Other Title:
- IEEE Std 1149.1-1990: IEEE Standard Test Access Port and Boundary - Scan Architecture
- Place of Publication:
- Piscataway, NJ : IEEE, 1990.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 1-55937-350-4
- 0-7381-0959-2
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