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2017 IEEE North Atlantic Test Workshop (NATW) / Institute of Electrical and Electronics Engineers.
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Random access memory--Testing.
- Random access memory.
- Physical Description:
- 1 online resource
- Other Title:
- 2017 IEEE North Atlantic Test Workshop
- Place of Publication:
- Piscataway, NJ : IEEE, 2017.
- Summary:
- Annotation The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs In addition to traditional topics, the 26th NATW will feature a general theme of Synthesis and Reliability Topics are not limited to, the following Analog, Mixed Signal and RF Testing Built In Self Test (BIST) Board Level Testing Delay and Performance Testing Design Verification Validation Diagnosis and Debug Fault Modeling Simulation FPGA and Embedded Core Testing IDDQ Testing DFM, Defect Analysis and Defect Based Testing Memory and MEMS Testing Nanotechnology Testing Online Testing System on Chip (SoC) Test and DebugTest Quality System Reliability.
- Notes:
- Description based on print version record.
- ISBN:
- 9781509059027
- 1509059024
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