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2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) / Institute of Electrical and Electronics Engineers (IEEE).
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers (IEEE), author, issuing body.
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Congresses.
- Integrated circuits.
- Microelectronics--Congresses.
- Microelectronics.
- Physical Description:
- 1 online resource : illustrations
- Other Title:
- 2017 International Symposium on VLSI Design, Automation and Test
- Place of Publication:
- Piscataway, New Jersey : Institute of Electrical and Electronics Engineers (IEEE), 2017.
- Summary:
- RF, analog and mixed signal circuits Sensors and interface circuits Digital circuits and ASIC CPU, DSP and multicore architectures Memory circuits and systems Low power logic and architectures Multimedia processing circuits Communication circuits Embedded systems and software Designs using novel technologies System in package design Electronic System Level Design Modeling and simulation Hardware software co design Logic and architecture synthesis.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 1-5090-3969-4
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