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2017 IEEE 35th VLSI Test Symposium (VTS) / Institute of Electrical and Electronics Engineers.
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Testing--Congresses.
- Integrated circuits.
- Physical Description:
- 1 online resource (206 pages) : illustrations
- Other Title:
- 2017 IEEE 35th VLSI Test Symposium
- Place of Publication:
- Piscataway, NJ : IEEE, 2017.
- Summary:
- The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, debug and repair of microelectronic circuits and systems.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 1-5090-4482-5
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