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Third International Workshop on Building Analysis Datasets and Gathering Experience Returns for Security (BADGERS 2014) : Wrocław, Poland September 11, 2014 / Institute of Electrical and Electronics Engineers.
IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online
IEEE Xplore (IEEE/IET Electronic Library - IEL)- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- Database security--Congresses.
- Database security.
- Physical Description:
- 1 online resource (x, 90 pages) : illustrations
- Other Title:
- 2014 Third International Workshop on Building Analysis Datasets and Gathering Experience Returns for Security
- Place of Publication:
- Los Alamitos, CA : IEEE, [2014]
- Summary:
- Annotation The BADGERS workshop is the venue for research on Big Data for security The BADGERS workshop is positioned at the confluence of computer security and general purpose large scale data processing and aims at bringing together people (e g, researchers, practitioners, system administrators, security analysts) active in the emerging domain of security related data collection and analysis for Internet scale computer systems and networks.
- Contents:
- Preface
- Committees
- Sponsors
- Full Papers
- ANDRUBIS - 1,000,000 Apps Later: A View on Current Android Malware Behaviors
- Security and Privacy Measurements in Social Networks: Experiences and Lessons Learned
- Classification of SSL Servers based on their SSL Handshake for Automated Security Assessment
- Are We Missing Labels? A Study of the Availability of Ground-Truth in Network Security Research
- EyeBit: Eye-Tracking Approach for Enforcing Phishing Prevention Habits
- Short Papers
- The Vulnerability Dataset of a Large Software Ecosystem
- MATATABI: Multi-layer Threat Analysis Platform with Hadoop
- Collaborative Repository for Cybersecurity Data and Threat Information
- Author Index.
- Notes:
- Description based on publisher supplied metadata and other sources.
- Includes index.
- ISBN:
- 1-4799-8309-8
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