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2015 IEEE International Integrated Reliability Workshop Final Report : S. Lake Tahoe, California, October 11-15, 2015.
- Format:
- Book
- Author/Creator:
- Ryan, Jason, author.
- Language:
- English
- Subjects (All):
- Integrated circuits--Reliability--Congresses.
- Integrated circuits.
- Semiconductors--Reliability--Congresses.
- Semiconductors.
- Physical Description:
- 1 online resource (183 pages)
- Place of Publication:
- New York : IEEE, 2016.
- Contents:
- PLATFORM TECHNICAL PRESENTATIONS
- POSTER PRESENTATIONS-REFEREED
- POSTER PRESENTATIONS-OPEN
- Tutorials
- Discussion Group (DG) Summaries
- BIOGRAPHIES
- PICTURES.
- Notes:
- Description based on: online resource; title from pdf title page (IEEE Xplore Digital Library, viewed March 13, 2018).
- ISBN:
- 1-4673-7396-6
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