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2016 IEEE International Test Conference (ITC) / Institute of Electrical and Electronics Engineers.
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- Computer software--Testing--Congresses.
- Computer software.
- Electronic digital computers--Circuits--Testing--Congresses.
- Electronic digital computers.
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Physical Description:
- 1 online resource : illustrations
- Other Title:
- 2016 IEEE International Test Conference
- Place of Publication:
- Piscataway, NJ : IEEE, 2016.
- Summary:
- Annotation International Test Conference, the cornerstone of TestWeek events, is the world s premier conference dedicated to the electronic test of devices, boards and systems covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 1-4673-8773-8
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