2016 IEEE International Integrated Reliability Workshop (IIRW) / Institute of Electrical and Electronics Engineers.

Format:

Book

Author/Creator:

Institute of Electrical and Electronics Engineers, author, issuing body.

Language:

English

Subjects (All):

Integrated circuits--Reliability--Congresses.

Integrated circuits.

Semiconductors--Reliability--Congresses.

Semiconductors.

Physical Description:

1 online resource : illustrations

Other Title:

2016 IEEE International Integrated Reliability Workshop

Place of Publication:

Piscataway, New Jersey : IEEE, 2016.

Summary:

We invite you to submit a presentation proposal that addresses any semiconductor related reliability issue, including the following topics resistive memories, high k and nitrided SiO2 gate dielectrics, reliability assessment of novel devices, III V, SOI, emerging memory technologies, transistor reliability including hot carriers and NBTI PBTI, root cause defects (physical mechanisms and simulations), Cu interconnects and low k dielectrics, impact of transistor degradation on circuit reliability, designing in reliability (products, circuits, systems, processes), customer product reliability requirements manufacturer reliability tasks, wafer level reliability tests (test approaches and reliability test structures), reliability modeling and simulation, optoelectronics, and single event upsets.

Notes:

Description based on publisher supplied metadata and other sources.

ISBN:

1-5090-4193-1