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2017 International Conference of Microelectronic Test Structures (ICMTS) / Institute of Electrical and Electronics Engineers (IEEE).
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers (IEEE), author, issuing body.
- Language:
- English
- Subjects (All):
- Microelectronics--Congresses.
- Microelectronics.
- Physical Description:
- 1 online resource : illustrations
- Other Title:
- 2017 International Conference of Microelectronic Test Structures
- Place of Publication:
- Piscataway, New Jersey : Institute of Electrical and Electronics Engineers (IEEE), 2017.
- Summary:
- The scope of this conference is to bring together designers and users of test structures to discuss recent developments and futures directions.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 1-5090-3615-6
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