Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 / Institute of Electrical and Electronics Engineers (IEEE).

Format:

Book

Author/Creator:

Institute of Electrical and Electronics Engineers (IEEE), author, issuing body.

Language:

English

Subjects (All):

Computer-aided design--Congresses.

Computer-aided design.

Electronic industries--Automation--Congresses.

Electronic industries.

Physical Description:

1 online resource : illustrations

Other Title:

Design, Automation & Test in Europe Conference & Exhibition

Place of Publication:

Piscataway, New Jersey : Institute of Electrical and Electronics Engineers (IEEE), 2017.

Summary:

The DATE conference addresses all aspects of research into technologies for electronic and embedded system engineering It covers the design process, test, and automation tools for electronics ranging from integrated circuits to distributed embedded systems This includes both hardware and embedded software design issues The conference scope also includes the elaboration of design requirements and new architectures for challenging application fields such as telecoms, wireless communications, multimedia, healthcare, smart energy and automotive systems Companies also present innovative industrial designs to foster the feedback from realworld design to research DATE also hosts a number of special sessions, events within the main technical programme such as panels, hot topic sessions, tutorials and workshops technical programme such as panels, hot topic sessions, tutorials and workshops.

Notes:

Description based on publisher supplied metadata and other sources.

ISBN:

3-9815370-8-4