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2016 11th International Design & Test Symposium (IDT) / Institute of Electrical and Electronics Engineers.

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

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Format:
Book
Author/Creator:
Institute of Electrical and Electronics Engineers, author, issuing body.
Language:
English
Subjects (All):
Electronic circuit design--Data processing.
Electronic circuit design.
Physical Description:
1 online resource
Other Title:
2016 11th International Design & Test Symposium
Place of Publication:
Piscataway, NJ : IEEE, 2016.
Summary:
Annotation The International Design and Test Symposium is an event devoted to exploring emerging challenges and new concepts related to the design, test, automation, and reliability of electronic systems ranging from integrated circuits through multi chip modules and printed circuit boards to full systems IDT is a unique forum to discuss best practices and novel ideas in design methods, tools, test, and reliability held in the Middle East and Africa (MEA) region.
Notes:
Description based on publisher supplied metadata and other sources.
ISBN:
1-5090-4900-2

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