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2016 IEEE 25th Asian Test Symposium (ATS) : proceedings : 21-24 November 2016, Hiroshima, Japan / Asian Test Symposium.
- Format:
- Book
- Conference/Event
- Conference Name:
- Asian Test Symposium, author.
- Language:
- English
- Subjects (All):
- Electronic digital computers--Circuits--Testing--Congresses.
- Electronic digital computers.
- Fault-tolerant computing--Congresses.
- Fault-tolerant computing.
- Electronic circuits--Testing--Congresses.
- Electronic circuits.
- Physical Description:
- 1 online resource (xxxii, 320 pages) : illustrations
- Other Title:
- 2016 IEEE 25th Asian Test Symposium
- Place of Publication:
- Los Alamitos, California : IEEE, 2016.
- Summary:
- Annotation The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind.
- Contents:
- Foreword
- Organizing Committee
- Program Committee
- Steering Committee
- Reviewers
- Tutorial 1: Industrial Advancements in Diagnosis Driven
- Yield Analysis
- Tutorial 2: Combining Structural and Functional Test
- Approaches across System Levels
- Keynote Address
- Invited Talks
- Special Plenary in Honor of Prof. Edward J. McCluskey
- Keynote in Honor of Prof. McCluskey
- Tributes to Prof. McCluskey
- 25th Anniversary Panel Session
- The 25th Anniversary Awards
- Sponsors
- ATS 2017 Call for Papers
- Session 1A: Delay Test and Simulation
- Session 1C: Hardware Security
- Session 2A: Special Session 1
- Session 2B: Analog and Mixed-Signal Test
- Session 2C: Scan Test
- Session 3A: Industry Session (Oral Presentation)
- Session 3C: Fault Diagnosis
- Session 4B: Fault Modeling
- Session 4C: Power-Aware Test
- Session 5A: Automatic Test Pattern Generation
- Session 5B: Built-In Self-Test
- Session 5C: 3D IC Testing
- Session 6A: Special Session 4: Managing Reliability of Integrated Circuits:
- Lifetime Metering and Design for Healing
- Session 6B: Fault Tolerance
- Session 6C: Analog Circuits and High-Speed I/O Test
- Session 7A: Memory Test and Reliability
- Session 7B: Dependable Systems
- Author Index.
- Notes:
- Description based on publisher supplied metadata and other sources.
- Includes index.
- ISBN:
- 1-5090-3809-4
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