2016 46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshop (DSN-W) / Institute of Electrical and Electronics Engineers.

Format:

Book

Author/Creator:

Institute of Electrical and Electronics Engineers, author, issuing body.

Language:

English

Subjects (All):

Computational complexity--Congresses.

Computational complexity.

Fault-tolerant computing--Congresses.

Fault-tolerant computing.

Physical Description:

1 online resource (various pagings) : illustrations

Other Title:

2016 46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshop

Place of Publication:

Piscataway, NJ : IEEE, 2016.

Summary:

Annotation Presenting the very best research results, problem solutions and insights on new challenges in the field of dependable computing and security.

Contents:

[Front cover]

[Title page i]

[Title page iii]

[Copyright notice]

Table of contents

Greetings from the General Chairs

Message from the Workshop Chairs

Foreword for the Industrial Track

Message from the Tutorial Chairs

Organizing Committee

Program Committee

Steering Committee

Introduction to RADIANCE 2016

Use of Similarity Measure to Suggest the Existence of Duplicate User Stories in the Srum Process.

Notes:

Description based on publisher supplied metadata and other sources.

ISBN:

1-5090-3688-1