1 option
2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) : 28-30 Sept. 2016 / IEEE Accelerated Stress Testing & Reliability Conference.
IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online
IEEE Xplore (IEEE/IET Electronic Library - IEL)- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE Accelerated Stress Testing & Reliability Conference, author.
- Language:
- English
- Subjects (All):
- Accelerated life testing--Congresses.
- Accelerated life testing.
- Physical Description:
- 1 online resource : illustrations
- Other Title:
- 2016 IEEE Accelerated Stress Testing & Reliability Conference
- Place of Publication:
- Piscataway, New Jersey : IEEE, 2016.
- Summary:
- Annotation Accelerated stress testing is a key tool within a well structured development program, being able to focus timely opportunities for product improvement and being able to deliver assured product performance This year s workshop will deliver detailed case studies, best practices, lessons learned and clear insight designed.
- Contents:
- Accelerated life testing of a commercial door handle
- Accelerated stress & reliability testing for software and cyber-physical systems
- An accelerated on-wafer test to improve long-term reliability of a 0.25 μm PHEMT process
- Challenges in setting up and analyzing a multi-stress accelerated test
- Cover glass behavior in handheld device drop: modeling; validation and design evaluation
- Critical review of U.S. Military environmental stress screening (ESS) handbook
- HASS Rapid Change-Over Process
- Impact of dormancy periods on power cycling of insulated gate bipolar transistors (IGBTS)
- Planning of reliability life tests within the accuracy, time and cost triangle
- Probabilistic reliability evaluation of space system considering physics of fatigue failure
- Reliability of corner staked surface mount packages
- Reliability of conformal coated surface mount packages
- Sustaining quality of services through service reliability and availability
- Thin MLCC (multi-layer ceramic capacitor) reliability evaluation using an accelerated ramp voltage test
- Tools for analysis of accelerated life and degradation test data.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 1-5090-1880-8
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.