Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach / edited by Yichuang Sun.

Format:

Book

Contributor:

Sun, Yichuang.

Institution of Engineering and Technology.

Series:

IET circuits, devices and systems series ; 19.

Circuits, devices and systems series ; 19

Language:

English

Subjects (All):

Linear integrated circuits--Testing.

Linear integrated circuits.

Mixed signal circuits--Testing.

Mixed signal circuits.

Radio frequency integrated circuits--Testing.

Radio frequency integrated circuits.

Physical Description:

1 online resource (411 p.)

Place of Publication:

London : Institution of Engineering and Technology, 2008.

Language Note:

English

System Details:

Access using campus network via VPN at home (THEi Users Only).

Summary:

This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits and systems in a single source.

Contents:

Contents; Preface; List of contributors; 1 Fault diagnosis of linear and non-linear analogue circuits; 2 Symbolic function approaches for analogue fault diagnosis 37Stefano Manetti and Maria Cristina Piccirilli; 3 Neural-network-based approaches for analogue circuit faultdiagnosis; 4 Hierarchical/decomposition techniques for large-scale analoguediagnosis; 5 DFT and BIST techniques for analogue and mixed-signal test; 6 Design-for-testability of analogue filters; 7 Test of A/D converters: From converter characteristics to built-inself-test proposals; 8 Test of Sigma Delta converters

9 Phase-locked loop test methodologies: Current characterization and production test practices10 On-chip testing techniques for RF wireless transceiver systemsand components; 11 Tuning and calibration of analogue, mixed-signal and RF circuits; Index

Notes:

Description based upon print version of record.

Includes bibliographical references and index.

ISBN:

1-281-97130-8

9786611971304

1-61583-315-3

0-86341-999-2

OCLC:

456124034