Advances in imaging and electron physics. Volume 193 / edited by Peter W. Hawkes.

Format:

Book

Contributor:

Hawkes, P. W., editor.

Series:

Advances in Imaging and Electron Physics 193

Advances in Imaging and Electron Physics, 1076-5670 ; Volume 193

Language:

English

Subjects (All):

Image processing.

Physical Description:

1 online resource (160 p.)

Edition:

1st ed.

Other Title:

Advances in imaging and electron physics. Volume one hundred and ninety three

Place of Publication:

Amsterdam, [Netherlands] : Academic Press, 2016.

Language Note:

English

Summary:

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image.

Contents:

Front Cover; Advances in Imaging and Electron Physics; Copyright; Contents; Preface; Future Contributions; Contributors; Erratum; Chapter One: Utilizing the Eigen-Emittance Concept for Bright Electron Beams; 1. Introduction; 2. Theory; 2.1. Lagrangians, Hamiltonians, and Coordinates; 2.1.1. Lagrangian for Charged Particle Motion; 2.1.2. Brief Review of Hamiltonian Mechanics; 2.1.2.1. Definition of Canonical Momenta; 2.1.2.2. Definition of Hamiltonian; 2.1.2.3. Definition of Poisson Bracket; 2.1.2.4. The Fundamental Poisson Brackets

2.1.2.5. Symplectic Condition and Definition of Symplectic Map2.1.3. Charged-Particle Hamiltonian with Time as the Independent Variable; 2.1.3.1. Definition of Canonical and Mechanical Momenta; 2.1.3.2. Definition of Hamiltonian; 2.1.4. Hamiltonian with Some Coordinate as Independent Variable; 2.1.4.1. The General Case; 2.1.4.2. Application to Charged-Particle Motion; 2.1.5. Deviation Variables and Deviation Variable Hamiltonian; 2.1.5.1. General Deviation Variables; 2.1.5.2. General Deviation Variable Hamiltonian; 2.1.5.3. Deviation Variables in a Specific Case

2.1.5.4. Deviation Variable Hamiltonian in a Specific Case2.1.6. Scaled Deviation Variables and Their Associated Hamiltonian; 2.1.6.1. Dimensionless Scaled Deviation Variables; 2.1.6.2. Scaled, Deviation Variable Hamiltonian; 2.2. Moments and Moment Transport; 2.2.1. Kinematic Moment Invariants; 2.2.2. Properties of Second-Order Moments; 2.2.2.1. Positive Definite Property; 2.2.2.2. Transformation Properties; 2.2.2.3. Williamson Normal Form; 2.2.2.4. Eigen-emittances; 2.2.3. Classical Uncertainty Principle; 2.2.4. Minimum Emittance Theorem; 2.2.5. Lack of Existence of Maximum Emittances

2.2.6. Summary3. Construction of Initial Distributions; 4. Applications to Bright Electron Beams; 4.1. Applications in Two Dimensions; 4.1.1. Flat Beam Transform; 4.1.2. Transverse-to-Longitudinal Emittance Exchange; 4.2. Manipulation of the Full Phase Space; 5. Summary and Discussion; References; Chapter Two: Analytical Methods for the Calculation and Simulation of New Schemes of Static and Time-of-Flight Mass Spect ...; 1. Introduction; 2. Analytical Equations for Calculating the Dynamics of the Charged Particle Beam and Their General Properties

2.1. The Differential Equations Defining the Deflection of Particles of an Ion Beam from an Axial Trajectory in Electric ...2.2. Some Common Properties of COS with a Mean Plane; 2.3. Newtonś Equations in Dimensionless Variables; 3. Analytical Methods of Calculating 2D Fields and Fields Reduced to the 2D Ones; 3.1. Conic Electric and Magnetic Field Calculation; 3.2. Calculation of Electrostatic Fields with Axial and Transaxial Symmetry; 3.3. Influence of the Fringe Field on the Motion of the Charged Particles in Flat and Cylindrical Capacitors

4. Numerical Calculation of Instrument Characteristics of Static and TOF Mass Spectrometers

Notes:

Description based upon print version of record.

Includes bibliographical references at the end of each chapters and index.

Description based on online resource; title from PDF title page (ebrary, viewed February 12, 2016).

Description based on publisher supplied metadata and other sources.

ISBN:

9780128052310

0128052317

OCLC:

936627848