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Value analysis tear-down [electronic resource] : a new process for product development and innovation / Yoshihiko Sato and J. Jerry Kaufman.
- Format:
- Book
- Author/Creator:
- Sato, Yoshihiko.
- Kaufman, J. Jerry., Author.
- Language:
- English
- Subjects (All):
- Industrial productivity.
- Engineering economy.
- New products.
- Value analysis (Cost control).
- Genre:
- Electronic books.
- Edition:
- 1st ed.
- Other Title:
- Value analysis tear-down
- Place of Publication:
- New York, N.Y. : Industrial Press : Society of Manufacturing Engineers, 2005 (Norwood, Mass. : Books24x7.com [generator])
- Language Note:
- English
- Notes:
- Title from title screen.
- Digitized and made available by: Books24x7.com.
- Includes bibliographical references and index.
- ISBN:
- 1-61583-579-2
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