1 option
Stress Induced Phenomena and Reliability in 3D Microelectronics : Kyoto, Japan, 28-30 May 2012
- Format:
- Book
- Conference/Event
- Author/Creator:
- International Workshop on Stress-Induced Phenomena in Microelectronics, Corporate Author.
- Conference Name:
- International Workshop on Stress-Induced Phenomena in Microelectronics (12th : 2012 : Kyoto, Japan), creator.
- International Workshop on Stress-Induced Phenomena in Microelectronics
- Series:
- AIP Proceedings Stress Induced Phenomena and Reliability in 3D Microelectronics
- Language:
- English
- Subjects (All):
- Three-dimensional integrated circuits--Congresses.
- Three-dimensional integrated circuits.
- Other Title:
- Stress Induced Phenomena And Reliability In 3D Microelectronics, Volume 1601
- Place of Publication:
- [Place of publication not identified] AIP Publishing 2014
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- ISBN:
- 0-7354-1235-9
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.