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Stress induced phenomena in metallization : fourth international workshop, Tokyo, Japan, June, 1997
- Format:
- Book
- Conference/Event
- Conference Name:
- International Workshop on Stress-Induced Phenomena in Metallization (4th : 1997 : Tokyo, Japan)
- Series:
- AIP conference proceedings Stress induced phenomena in metallization
- Language:
- English
- Subjects (All):
- Integrated circuits--Defects--Congresses.
- Integrated circuits.
- Thin film devices--Defects--Congresses.
- Thin film devices.
- Electrodiffusion--Congresses.
- Electrodiffusion.
- Metallic films--Congresses.
- Metallic films.
- Electrochemical metallizing--Congresses.
- Electrochemical metallizing.
- Aluminum films--Congresses.
- Aluminum films.
- Semiconductors--Defects--Congresses.
- Semiconductors.
- Liquid crystal devices--Defects--Congresses.
- Liquid crystal devices.
- Acoustic surface wave devices--Defects--Congresses.
- Acoustic surface wave devices.
- Other Title:
- Fourth International Workshop On Stress Induced Phenomena In Metallization, Volume 418
- Place of Publication:
- [Place of publication not identified] American Institute of Physics 1998
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- ISBN:
- 1-56396-682-4
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