1 option
Stress-induced phenomena in metallization : first international workshop, Ithaca, NY, 1991
- Format:
- Book
- Series:
- Conference proceedings Stress-induced phenomena in metallization
- Language:
- English
- Subjects (All):
- Semiconductors--Defects--Congresses.
- Semiconductors.
- Metallic films--Congresses.
- Metallic films.
- Thin film devices--Congresses--Defects.
- Thin film devices.
- Aluminum films--Congresses.
- Aluminum films.
- Metallizing--Congresses.
- Metallizing.
- Other Title:
- Stress-Induced Phenomena In Metallization: First International Workshop, Volume 263
- Stress-Induced Phenomena In Metallization
- Place of Publication:
- [Place of publication not identified] American Institute of Physics 1992
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- ISBN:
- 1-56396-082-6
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.