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Frontiers of characterization and metrology for nanoelectronics : 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Albany, New York, 11-15 May 2009
- Format:
- Book
- Conference/Event
- Author/Creator:
- International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Corporate Author.
- Conference Name:
- International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (2009 : Albany, N.Y.)
- International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
- Series:
- AIP conference proceedings Frontiers of characterization and metrology for nanoelectronics
- Language:
- English
- Subjects (All):
- Integrated circuits--Ultra large scale integration--Congresses.
- Integrated circuits.
- Integrated circuits--Ultra large scale integration--Congresses--Software.
- Other Title:
- Frontiers Of Characterization And Metrology For Nanoelectronics: 2009, Volume 1173
- Place of Publication:
- [Place of publication not identified] AIP Conference Proceedings 2009
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- ISBN:
- 0-7354-0712-6
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