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X-Ray Optics and Microanalysis: Proceedings of the 20th International Congress

AIP Conference Proceedings (American Institute of Physics) Available online

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Format:
Book
Conference/Event
Author/Creator:
International Congress on X-ray Optics and Microanalysis, Corporate Author.
Contributor:
Walker, Clive T., Contributor.
Denecke, Melissa A., Contributor.
Conference Name:
International Congress on X-ray Optics and Microanalysis
Series:
AIP conference proceedings X-ray optics and microanalysis
Language:
English
Subjects (All):
X-ray optics--Microscopy--Congresses.
X-ray optics.
Materials--Congresses.
Materials.
X-ray microanalysis--Congresses.
X-ray microanalysis.
X-ray microscopes--Congresses.
X-ray microscopes.
Other Title:
X‐RAY OPTICS AND MICROANALYSIS
X‐Ray Optics And Microanalysis: Proceedings Of The 20Th International Congress, Volume 1221
X‐Ray Optics And Microanalysis
20th International Congress on X-ray Optics and Microanalysis
ICXOM20
Place of Publication:
[Place of publication not identified] A I P Press Imprint 2010
Language Note:
English
Contents:
Advances in instrumentation, detection, and methodology
X-ray optics monochromators and multilayers, focusing optics
Quantitative and multivariate analysis
Imaging techniques and image processing
Applications of nano-, micro-, and surface analysis techniques.
Notes:
Bibliographic Level Mode of Issuance: Monograph
ISBN:
0-7354-0764-9

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