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Stress-induced phenomena in metallization : Sixth International Workshop on Stress-Induced Phenomena in Metallization, Ithaca, New York, 25-27 July 2001
- Format:
- Book
- Conference/Event
- Author/Creator:
- International Workshop on Stress-Induced Phenomena in Metallization, Corporate Author.
- Conference Name:
- International Workshop on Stress-Induced Phenomena in Metallization (6th : 2001 : Ithaca, N.Y.)
- International Workshop on Stress-Induced Phenomena in Metallization.
- Series:
- AIP conference proceedings Stress-induced phenomena in metallization
- Language:
- English
- Subjects (All):
- Integrated circuits--Defects--Congresses.
- Integrated circuits.
- Thin film devices--Defects--Congresses.
- Thin film devices.
- Electrodiffusion--Congresses.
- Electrodiffusion.
- Other Title:
- Stress-Induced Phenomena In Metallization: Sixth International Workshop On Stress-Induced Phenomena In Metallization, Volume 612
- Place of Publication:
- [Place of publication not identified] American Institute of Physics 2002
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- ISBN:
- 0-7354-0058-X
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