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Frontiers of characterization and metrology for nanoelectronics : 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Gaithersburg, Maryland, 27-29 March 2007
- Format:
- Book
- Conference/Event
- Author/Creator:
- International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Corporate Author.
- Conference Name:
- International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (2007 : Gaithersburg, Md.)
- Series:
- AIP conference proceedings Frontiers of characterization and metrology for nanoelectronics
- Language:
- English
- Subjects (All):
- Integrated circuits--Ultra large scale integration--Congresses.
- Integrated circuits.
- Nanoelectronics--Congresses.
- Nanoelectronics.
- Other Title:
- International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
- Place of Publication:
- [Place of publication not identified] American Institute of Physics 2007
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- ISBN:
- 0-7354-0441-0
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