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Stress-induced phenomena in metallization : eighth International Workshop on Stress-Induced Phenomena in Metallization, Dresden, Germany, 12-14 September 2005

AIP Conference Proceedings (American Institute of Physics) Available online

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Format:
Book
Conference/Event
Author/Creator:
International Workshop on Stress-Induced Phenomena in Metallization, Corporate Author.
Contributor:
Zschech, Ehrenfried, Contributor.
Conference Name:
International Workshop on Stress-Induced Phenomena in Metallization (8th : 2005 : Dresden, Germany)
International Workshop on Stress-Induced Phenomena in Metallization
Series:
AIP conference proceedings Stress-induced phenomena in metallization
Language:
English
Subjects (All):
Integrated circuits--Defects--Congresses.
Integrated circuits.
Metal-metal bonds--Defects--Congresses.
Metal-metal bonds.
Semiconductors--Congresses.
Semiconductors.
Other Title:
Stress induced phenomena in metallization
Place of Publication:
[Place of publication not identified] American Institute of Physics 2006
Language Note:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph
ISBN:
0-7354-0310-4

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