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IEC standard for extensions to standard test interface language (STIL) for DC level specification.
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author, issuing body.
- Language:
- English
- Subjects (All):
- Standards, Engineering.
- Integrated circuits--Testing.
- Integrated circuits.
- Physical Description:
- 1 online resource (44 pages)
- Place of Publication:
- New York : IEEE, 2007.
- Summary:
- This standard extends IEEE Std 1450-1999 (STIL) to support the definition of DC levels. STIL language constructs are defined to specify the DC conditions necessary to execute digital vectors on automated test equipment (ATE). STIL language extensions include structures for: (a) specifying the DC conditions for a device under test; (b) specifying DC conditions either globally, by pattern burst, by pattern, or by vector; (c) specifying alternate DC levels; and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.
- Notes:
- Description based on: online resource; title from title screen (IEEE Xplore Digital Library, viewed Oct. 19, 2017).
- ISBN:
- 0-7381-5723-6
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