Monte Carlo modeling for electron microscopy and microanalysis / David C. Joy.

Format:

Book

Author/Creator:

Joy, David C., 1943- author.

Series:

Oxford series in optical and imaging sciences ; 9.

Oxford scholarship online.

Oxford scholarship online

Language:

English

Subjects (All):

Electron microscopy--Computer simulation.

Electron microscopy.

Electron probe microanalysis--Computer simulation.

Electron probe microanalysis.

Monte Carlo method.

Physical Description:

1 online resource (225 p.)

Edition:

1st ed.

Place of Publication:

New York : Oxford University Press, 2023.

Language Note:

English

Summary:

1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and Imaging. 10. X-Ray Production and Micro-Analysis. 11. What Next in Monte Carlo Simulations?

Contents:

Contents; 1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index

Notes:

Previously issued in print: 1995.

Includes bibliographical references.

Derived record based on print version record and publisher information.

ISBN:

0-19-773242-9

1-280-53489-3

9786610534890

0-19-535846-5

OCLC:

435816746