Defects and diffusion in semiconductors. XI : an annual retrospective / D.J. Fisher.

Format:

Book

Contributor:

Fisher, D. J.

Series:

Diffusion and defect data. Defect and diffusion forum ; Pt. A, v. 282.

Defects and diffusion forum, 1012-0386 ; v. 282

Language:

English

Subjects (All):

Semiconductors--Defects.

Semiconductors.

Semiconductors--Diffusion.

Physical Description:

1 online resource (160 p.)

Edition:

1st ed.

Place of Publication:

Stafa-Zuerich, Switzerland : TTP, Trans Tech Publications, [2008]

Language Note:

English

Summary:

This eleventh volume in the series covering the latest results in the field includes abstracts of papers which have appeared since the publication of Annual Retrospective X (Volume 272). As well as the 295 metals abstracts, the issue includes - in line with the new editorial policy of including original papers on all of the major material groups: ""Structural and Electron-Hopping Studies of Pr- and Nd-Substituted La2/3Ba1/3MnO3 Manganites"" (H.Abdullah and S.A.Halim), ""Recrystallization Annealing of Cold-Rolled 9Cr-1Mo Ferritic Steel Containing Silicon"" (M.N.Mungole, M.Surender, R.Balasubram

Contents:

Defects and Diffusion in Semicondutors, 2009; Table of Contents; Structural and Electron-Hopping Studies of Pr and Nd Substituted La2/3Ba1/3MnO3 Manganites; Recrystallization Annealing of Cold Rolled 9Cr 1Mo Ferritic Steel Containing Silicon; Quantitative Concept for Morphological Stability Analysis of Liquid-Solid Interface in Rapid Solidification of Dilute Binary Alloys; Studies of the Spin Hamiltonian Parameters for NiX2 and CdX2:Ni2+ (X=Cl, Br); Abstracts; Keywords Index; Authors Index

Notes:

Description based upon print version of record.

Includes bibliographical references and indexes.

Description based on online resource; title from PDF title page (ebrary, viewed November 01, 2013).

ISBN:

3-03813-208-X

OCLC:

897070548