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Defects and diffusion studied using PAC spectroscopy / edited by Herbert Jaeger, Matthew O. Zacate.
- Format:
- Book
- Series:
- Diffusion and defect data. Defect and diffusion forum ; Pt. A, v. 311.
- Defect and diffusion forum, 1012-0386 ; v. 311
- Language:
- English
- Subjects (All):
- Solids--Defects.
- Solids.
- Diffusion.
- Angular correlations (Nuclear physics).
- Perturbation (Quantum dynamics).
- Physical Description:
- 1 online resource (185 p.)
- Edition:
- 1st ed.
- Place of Publication:
- Zurich-Durnten, Switzerland : Trans Tech Publications, [2011]
- Language Note:
- English
- Summary:
- The motivation for this special-topic volume was two-fold. Among the various techniques for probing material properties at the atomic scale, PAC is a somewhat hidden gem. This is partly because PAC requires the use of radioisotopes; thus rendering it almost useless as a non-destructive characterization method. Moreover, there are relatively few PAC isotopes available; so it is not always possible to apply PAC to the most technologically pressing problems. Thus, PAC studies of materials are often more fundamental, and less applied, in nature. One of the goals of this volume was to raise the pro
- Contents:
- Defects and Diffusion Studied Using PAC Spectroscopy; Preface; Table of Contents; 1. Review Articles; Perturbed Angular Correlation Spectroscopy - A Tool for the Study of Defects and Diffusion at the Atomic Scale; Impurities in Magnetic Materials Studied by PAC Spectroscopy; Impurity Centers in Oxides Investigated by γ-γ Perturbed Angular Correlation Spectroscopy and Ab Initio Calculations; Can PAC Measurements be Used to Investigate Defects in Nano-Structures?; 2. Current Research Articles
- TiO2 Nanomaterials Studied by 44Ti(EC)44Sc Time Differential Perturbed Angular Correlations: Volume and Surface PropertiesComparison of Jump Frequencies of 111In/Cd Tracer Atoms in Sn3R and In3R Phases Having the L12 Structure (R = Rare-Earth); Implanted Impurities in Wide Band Gap Semiconductors; Keywords Index; Authors Index
- Notes:
- "Special topic volume with invited peer reviewed papers only."
- Includes bibliographical references and index.
- Description based on print version record.
- ISBN:
- 3-03813-516-X
- OCLC:
- 868960583
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