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Defects and diffusion, theory and simulation : an annual retrospective II / editor, D.J. Fisher.
LIBRA QD543 .D49 v.57-v.235/236 (2004),v.249 (2006)-v.250 (2006), v.253 (2006)-v.295/296 (2009)
Available from offsite location
- Format:
- Book
- Series:
- Diffusion and defect data. Defect and diffusion forum ; 1012-0386 Pt. A, v. 307.
- Diffusion and defect data. Part A, Diffusion and defect forum, 1012-0386 ; v. 307
- Language:
- English
- Subjects (All):
- Semiconductors--Defects.
- Semiconductors.
- Semiconductors--Diffusion.
- Physical Description:
- 1 online resource (194 p.)
- Edition:
- 1st ed.
- Place of Publication:
- Stafa-Zurich ; Enfield, NH : Trans Tech Publications, [2010]
- Language Note:
- English
- Summary:
- This second volume in a new series covering entirely general results in the fields of defects and diffusion includes 356 abstracts of papers which appeared between the end of 2009 and the end of 2010. As well as the abstracts, the volume includes original papers on theory/simulation, semiconductors and metals: ""Predicting Diffusion Coefficients from First Principles ..."" (Mantina, Chen & Liu), ""Gouge Assessment for Pipes ..."" (Meliani, Pluvinage & Capelle), ""Simulation of the Impact Behaviour of ... Hollow Sphere Structures"" (Ferrano, Speich, Rimkus, Merkel & Öchsner), ""Elastic-Plastic
- Contents:
- Defects and Diffusion, Theory & Simulation II; Table of Contents; Computational Fluid Dynamics (CFD) Based Simulated Study of Multi-Phase Fluid Flow; Role of Silicon in PM Processed Soft Magnetic Alloy; Voltage Switch of Nano-Size Zinc Oxide Ceramic Defected Barium; Self-Diffusion in Nano-ZnO; Localised Vibrational Mode in CuO:Sn (5 at%) Nanoparticles; A Brief Survey of the Literature on Silica Refractory Research and Development: The Case for Nanostructured Silica Obtained from Rice Husk Ash (RHA)
- Local Density Diffusivity (LDD-) Model for Boron Out-Diffusion of In Situ Boron-Doped Si0.75Ge0.25 Epitaxial Films Post Advanced Rapid Thermal Anneals with Carbon Co-ImplantGaAs Surface Composition Investigation during Al Thin Film Growth Using the CBE Method; Slow Positron Studies in Polymers; A Model and Simulated Analysis for Reliability and Failure in MEMS Fabrication; Abstracts; Keywords Index; Authors Index
- Notes:
- Description based upon print version of record.
- Includes bibliographical references and indexes.
- Description based on print version record.
- ISBN:
- 3-03813-378-7
- OCLC:
- 897640726
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