Radiation effects and soft errors in integrated circuits and electronic devices / editors, R.D. Schrimpf, D.M. Fleetwood.

Format:

Book

Contributor:

Schrimpf, Ronald Donald.

Fleetwood, D. M. (Dan M.)

Series:

Selected topics in electronics and systems ; vol. 34.

Selected topics in electronics and systems ; vol. 34

Language:

English

Subjects (All):

Electronic circuits--Effect of radiation on.

Electronic circuits.

Integrated circuits--Effect of radiation on.

Integrated circuits.

Physical Description:

1 online resource (349 p.)

Edition:

1st ed.

Place of Publication:

Singapore ; New Jersey : World Scientific Pub., c2004.

Language Note:

English

Summary:

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes t

Contents:

CONTENTS ; Preface ; Single Event Effects in Avionics and on the Ground ; 1. Introduction ; 2. Similarities between SEE in Avionics and on the Ground ; 3. Differences Between SEE in Avionics and on the Ground ; 4. Atmospheric and Ground Level Environments ; 5. SEE Data in devices

6. Summary Soft Errors in Commercial Integrated Circuits ; 1. Introduction ; 2. Scaling trends for memory devices ; 3. Seating trend for peripheral logic devices ; 4. Conclusion ; Single-Event Effects in lll-V Semiconductor Electronics ; 1. Introduction

2. Single-Event Effects in lll-V Electronic Devices 3. Summary and Conclusions ; Investigation of Single-Event Transients in Fast Integrated Circuits with a Pulsed Laser ; 1. Basic Mechanisms of a SET ; 2. SET Laser Testing ; 3. Experimental set-up for SET laser testing ; 4. Results

5. Conclusions System Level Single Event Upset Mitigation Strategies ; 1. Introduction ; 2. Systems Engineering for Energetic Particle Environment Compatibility ; 3. Fault Tolerant Systems Strategies ; Radiation-Tolerant Design for High Performance Mixed-Signal Circuits

1. Introduction 2. Radiation Mechanisms in Mixed-Signal Integrated Circuits ; 3. Process Component and Layout Choices for Hardened-by-Design Circuits ; 4. Total Dose Hardening ; 5. Single-Event Effect Hardening ; 6. Dose-Rate Effect Hardening ; 7. Conclusion

A Total-Dose Hardening-By-Design Approach for High-Speed Mixed-Signal CMOS Integrated Circuits

Notes:

Also published in the International Journal of High Speed Electronics and Systems, v. 14, no. 2 (2004) p. 285-623.

Includes bibliographical references.

ISBN:

9786611934590

9781281934598

1281934593

9789812794703

9812794700

OCLC:

879074235