Fluctuations and localization in mesoscopic electron systems / Martin Janssen.

Format:

Book

Author/Creator:

Janssen, M. (Martin)

Series:

World Scientific lecture notes in physics ; v. 64.

World Scientific lecture notes in physics ; v. 64

Language:

English

Subjects (All):

Fluctuations (Physics).

Quantum theory.

Mesoscopic phenomena (Physics).

Physical Description:

1 online resource (219 p.)

Edition:

1st ed.

Place of Publication:

Singapore ; River Edge, N.J. : World Scientific, c2001.

Language Note:

English

Summary:

The quantum phenomena of tunneling and interference show up not only in the microscopic world of atoms and molecules, but also in cold materials of the real world, such as metals and semiconductors. Though not fully macroscopic, such <i>mesoscopic</i> systems contain a huge number of particles, and the holistic nature of quantum mechanics becomes evident already in simple electronic measurements. The measured quantity fluctuates as a function of applied fields in an unpredictable, yet reproducible way. Despite this fingerprint character of fluctuations, their statistical properties are univer

Contents:

Contents ; Preface ; Chapter 1 Introduction ; Chapter 2 Experimental Facts ; 2.1 Aharonov-Bohm Effect ; 2.2 Conductance Fluctuations ; 2.3 Localization ; 2.4 Quantum Hall Effects ; 2.5 Quantum Dots ; Chapter 3 Basic Theoretical Models and Tools

3.1 Relevant Scales and Observables 3.2 The Independent Electron Approximation ; 3.3 Model Hamiltonian and Green's Function ; 3.4 Disorder Diagrams and Field Theory ; 3.5 Scattering Matrix Modeling ; 3.6 Fokker-Planck Equations ; Chapter 4 Idealized Systems ; 4.1 Localized Systems

4.2 Delocalized Systems 4.3 Random Matrices and Symmetry ; Chapter 5 Towards Realistic Systems ; 5.1 Concept of Scaling ; 5.2 Distributions and Typical Values ; 5.3 Corrections at Finite Conductances ; 5.4 Quasi-One-Dimensional Systems

Chapter 6 The Localization-Delocalization Transition 6.1 Finite Size Scaling ; 6.2 Real-Space Renormalization ; 6.3 Multifractality of Critical States ; 6.4 Point-Contact Conductance ; 6.5 Order Parameter and Scaling Variable ; Bibliography ; Index

Notes:

Description based upon print version of record.

Includes bibliographical references (p. 191-198) and index.

ISBN:

9786611948290

9781281948298

1281948292

9789812798923

9812798927

OCLC:

879023962